Live Quiz Arena
🎁 1 Free Round Daily
⚡ Enter ArenaQuestion
← TechnologyWhen operating a MOSFET beyond its Safe Operating Area, which failure mode results from exceeding the pulsed drain current?
A)Secondary breakdown failure✓
B)Gate oxide tunneling increases
C)Threshold voltage instability occurs
D)Increased subthreshold leakage
💡 Explanation
Secondary breakdown occurs, because current crowding causes localized hot spots leading to destructive thermal runaway; therefore the MOSFET fails catastrophically rather than experiencing gradual parameter degradation from gate oxide or threshold voltage shifts.
🏆 Up to £1,000 monthly prize pool
Ready for the live challenge? Join the next global round now.
*Terms apply. Skill-based competition.
Related Questions
Browse Technology →- Which outcome occurs when partial evaporator blockage restricts a scroll chiller's refrigerant flow?
- Which consequence results when hydraulic actuators experience 'stick-slip' during robot-arm welding?
- Which outcome predictably occurs when a cellular base station experiences significant co-channel interference increasing beyond design thresholds?
- Which outcome occurs when a residential air conditioner uses R-410A and experiences refrigerant overcharge?
- Which consequence results when channel estimation errors distort signal recovery in orthogonal frequency-division multiplexing (OFDM) systems?
- Which outcome occurs when a steel I-beam in bridge construction experiences repeated thermal expansion cycles under heavy load?
