Which consequence results when gate oxide breakdown occurs in flash memory?

💡 Explanation

When gate oxide breaks down, electrons tunnel through the damaged oxide layer, leading to charge leakage because of Fowler-Nordheim tunneling. Therefore, data retention degrades rather than improving threshold stability or write speeds, which require intact insulation.

• Which consequence results when rapid cooling of molten silicon bypasses nucleation?
• Which outcome results when thermal energy weakens intermolecular forces within a polymer?
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• Which risk increases when a closed vessel containing water exceeds its rated fill level during steam sterilization?
• Which outcome occurs when approaching the repulsive potential barrier in reverse-biased tunnel diode doped to degeneracy?
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