Which failure arises when an IGBT junction temperature exceeds limits?

💡 Explanation

Thermal runaway arises because increased temperature raises the leakage current across the p-n junction, which further increases heat, therefore creating a positive feedback loop leading to device destruction, rather than stabilizing effects from decreased current flow.

• Which risk dramatically increases during DWDM system reconfiguration?
• Which outcome occurs when a solid-state relay driving an inductive load experiences voltage overshoot?
• Which outcome occurs when a hermetic refrigeration compressor experiences 'oil logging'?
• Which risk increases when robotic arm joint encoders, using incremental quadrature encoding, experience high-frequency vibration while positioning?
• Which outcome occurs when robot arm joint velocity sensor readings are significantly biased?
• Which outcome occurs when rapid thermal cycling causes piston erosion in a direct injection engine?