Which failure develops when MOSFET hotspots exceed limits?

💡 Explanation

Thermal runaway induces gate rupture; the temperature increases channel conductivity and power dissipation, triggering further rise because positive feedback surpasses system cooling. Therefore, gate rupture follows, rather than merely slower switching or contact degradation. Electromigration causes slow degradation not sudden failure.

• On an aircraft with fly-by-wire, which consequence results when a pitot tube freezes?
• Which outcome occurs when pressure transients exceed valve response time during emergency hydraulic actuator shutdown?
• After flight, which outcome occurs when improper aircraft fueling permits water contamination in a turbine engine's fuel?
• Which outcome is triggered within silicon when subjected to avalanche breakdown?
• Which risk increases when electronically controlled diesel fuel injectors experience excessive back-leakage?
• Which outcome happens when a refrigeration system compressor overheats due to insufficient desuperheating?