Which failure mode arises in flash memory when scaling down cells?

💡 Explanation

Increased leakage current occurs via quantum tunneling across the oxide layer thinning as transistor sizes reduce, because electrons pass through rather than being blocked. This results in elevated off-state current, whereas other effects occur at coarser scales or involve different transport mechanisms.

• Which risk increases when a catalyst loses surface?
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• When temperature increases within an LED's active region, which outcome regarding electron energy occurs?
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• Which outcome results when a polymer electrolyte membrane's (PEM) humidity drops significantly in a hydrogen fuel cell?