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Which limitation arises during read/write cycling in magnetoresistive RAM (MRAM)?

A)Tunnel barrier dielectric breakdown
B)Antiferromagnetic layer domain switching
C)Increased Gilbert damping parameter
D)Reduced spin polarization efficiency

💡 Explanation

Tunnel barrier breakdown limits MRAM endurance because repeated reversals create dielectric stress. Voltage stress causes defect formation weakening the insulation, therefore electrical breakdown occurs, rather than slower domain switching processes.

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