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Which mechanism causes charge trapping within a capacitor's dielectric?

A)Ion migration due to the field
B)Quantum tunneling across thin oxide
C)Increased electron-phonon scattering rate
D)Breakdown causing localized metallic filaments

💡 Explanation

Ion migration causes charge trapping because the electric field forces mobile ions to accumulate near the dielectric interface, forming space charge; therefore trapping occurs due to mobile impurity migration, rather than through quantum tunneling or electron scattering which have different causes.

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