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Which mechanism causes data corruption when a CMOS sensor experiences excess signal?

A)Thermionic emission overwhelms well capacity
B)Avalanche breakdown affects doping profiles
C)Blooming contaminates adjacent pixels
D)Johnson noise inhibits charge transfer

💡 Explanation

Blooming occurs because carriers spill into adjacent pixels once the potential well of a pixel is full. This form of charge leakage due to photoelectron diffusion overwhelms confinement; therefore blooming corrupts data, rather than causing voltage breakdown or other noise effects.

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