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Which outcome arises when the oxide layer thickness increases in a flash memory cell write operation?

A)Reduced tunneling probability for electrons
B)Increased capacitive coupling between cells
C)Higher voltage threshold for memory erase
D)Faster charge injection into floating gate

💡 Explanation

When oxide layer thickness increases, the quantum tunneling probability decreases exponentially because electron tunneling is highly sensitive to barrier width. Therefore, reduced tunneling results, rather than increased coupling, higher voltage thresholds or faster injection which result from opposite changes in the oxide thickness or material properties.

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