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Which outcome occurs when a silicon wafer’s oxide coating thickness nears wavelengths used for inspection?

A)Destructive interference alters measured intensities
B)Increased Brownian motion blurs images
C)Refractive index matches substrate index
D)Coating transparency reaches maximum value

💡 Explanation

Destructive interference minimizes the reflected light intensity at specific wavelengths because reflected waves from the top and bottom surfaces of the silicon dioxide layer interfere. Therefore, intensity is altered, rather than index changing or transparency maximizing.

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