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Which outcome results when the oxide layer degrades in flash memory?

A)Unintended electron quantum tunneling occurs
B)Increased silicon lattice vibrational modes
C)Gate capacitance experiences dielectric breakdown
D)Elevated channel carrier mobility observed

💡 Explanation

Unintended data writes stem from electrons tunneling through the weakened oxide. This is because degradation increases the probability of quantum tunneling, therefore charge leaks, rather than capacitance change or mobility, which represent distinct failure mechanisms.

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