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Which phenomenon limits spatial resolution in electron microscopy when analyzing nanomaterials?

A)Diffraction arising from electron wavelength
B)Charging effects from beam accumulation
C)Thermal drift from sample heating
D)Vibrations stemming electromagnetic interference

💡 Explanation

When analyzing nanomaterials with electron microscopy, diffraction limits resolution of the resulting image because electrons exhibit wave-like properties described by De Broglie wavelength calculations, resulting in Airy disks/patterns. Therefore A is correct since electron diffraction blurs finest details of sample, not other causes.

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