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Which reliability risk increases during rapid temperature fluctuations in a BJT?

A)Kirk effect induced base widening
B)Emitter-base junction thermal runaway
C)Avalanche multiplication at the collector
D)Surface recombination velocity degradation

💡 Explanation

Thermal runaway risk increases dramatically because elevated temperatures at the emitter-base junction cause higher currents, which further increase local heating via the Joule effect; therefore, positive feedback accelerates failure rather than stabilizing the bias point.

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