Live Quiz Arena
🎁 1 Free Round Daily
⚡ Enter ArenaQuestion
← TechnologyWhich reliability risk increases within a bipolar junction transistor (BJT) circuit containing a Zener diode operating near its maximum rated power?
A)Increased junction thermal runaway✓
B)Amplification factor degradation
C)Collector-emitter voltage sag
D)Base current saturation effects
💡 Explanation
Junction thermal runaway risk increases because increased power dissipation in the Zener diode elevates its temperature, which raises the reverse leakage current. Therefore, with increased current, thermal runaway occurs, rather than normal stable operating conditions under rated specs.
🏆 Up to £1,000 monthly prize pool
Ready for the live challenge? Join the next global round now.
*Terms apply. Skill-based competition.
Related Questions
Browse Technology →- Which outcome occurs when a hydraulic actuator, used for rapid, cyclical positioning in an automated robotics assembly line, experiences accumulator pre-charge depletion?
- Which consequence results when a PLC fails spuriously in automated warehouse conveyor?
- Which risk increases when seawater permeates concrete rebar supports?
- Which outcome necessarily follows when using cascade trip breakers in a distribution panel system?
- Which consequence results when excessive hydrogen gas infiltrates quenched and tempered steel support columns?
- Which consequence results when turbine over-speeding in turboprop aircraft?
