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Which risk increases inside integrated circuit cavities awaiting solder reflow?

A)Copper electromigration within transistors
B)Dendritic growth from residual moisture
C)Oxidation rate of exposed bondpads
D)Increased thermal carrier mobility

💡 Explanation

Dendritic growth accelerates between closely spaced conductors due to residual moisture; capillary condensation raises the concentration of ionic contaminants. Therefore, dendritic growth increases within confined spaces, because electrodeposition of metal ions is enhanced, rather than thermal effects or other changes.

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