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Which risk increases when a crystalline silicon ingot’s lattice structure contains elevated interstitial oxygen?

A)Enhanced minority carrier recombination rate
B)Increased piezoelectric coefficient magnitude
C)Reduced free carrier scattering events
D)Higher radiative recombination efficiency

💡 Explanation

Minority carrier recombination elevates with oxygen impurities. Oxygen causes *defect formation*, because these localized distortions in the lattice create mid-gap states that act as recombination centers; therefore, excess oxygen enhances recombination rather than reducing carrier scattering.

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