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Which risk increases when a MOSFET, used as a high-side switch controlling an inductive load in a DC-DC buck converter, turns off?

A)Avalanche breakdown occurs within MOSFET
B)Gate oxide stress reduces lifespan
C)Thermal runaway accelerates degradation
D)Latch-up permanently damages the CMOS

💡 Explanation

Avalanche breakdown is likely because the inductive load causes a voltage spike when the MOSFET turns off, exceeding the device's breakdown voltage; the parasitic inductance discharges via avalanche, therefore potentially destroying the MOSFET rather than causing gate oxide or thermal effects

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