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← ScienceWhich risk increases when a pulsed electromagnetic field exceeds shielding limits?
A)Component malfunction due to induced currents✓
B)Increased thermal noise in semiconductors
C)Crystal structure dislocation in metals
D)Enhanced radioactive decay of insulators
💡 Explanation
Exceeding the EM shielding limit induces unwanted voltages via electromagnetic induction, this causes currents in sensitive components. Therefore, malfunction increases rather than thermal noise or structure change, because EM induction dominates at faster pulses.
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