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Which risk increases when an integrated circuit’s decoupling capacitor ages?

A)Circuit thermal runaway occurs rapidly
B)Electromagnetic interference emission strengthens
C)Gate oxide breakdown damage increases
D)Dopant diffusion creates leakage paths

💡 Explanation

Increased electromagnetic interference results because the equivalent series inductance of the ageing capacitor rises, limiting Suppression of transient currents from digital switching via impedance matching, rather than signal integrity improving, because the capacitance decreases, therefore EMI rejection at the IC degrades.

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