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Which risk increases when applying excessive voltage across a MOSFET gate?

A)Gate-oxide dielectric breakdown
B)Increased channel mobility
C)Reduced subthreshold swing
D)Faster carrier transit time

💡 Explanation

Excessive voltage can cause gate-oxide dielectric breakdown because it enhances electron tunneling through the gate oxide, leading to a short circuit. Therefore, breakdown is the outcome, rather than enhanced mobility; different voltages influence mobility.

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