Which risk increases when high voltage is applied to metal oxide varistor material containing ionic defects?

💡 Explanation

When high voltage is applied, ionic defects within the metal oxide varistor (MOV) material undergo migration due to electrostatic forces, causing localized increase in conductivity, leading to dielectric breakdown. Therefore, dielectric breakdown results, rather than thermal runaway, surface arcing, or mechanical stress which occur through different failure mechanisms..

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