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Which risk increases when rapid thermal cycling stresses a BGA (ball grid array)?

A)Solder joint fatigue accelerates
B)Dielectric breakdown threshold lowers
C)Substrate delamination probability decreases
D)Trace electromigration velocity decelerates

💡 Explanation

Repeated thermal cycling causes large temperature gradients, therefore thermo-mechanical stresses induce solder joint fatigue because of differences in thermal expansion, leading to crack propagation, rather than affecting dielectric breakdown or electromigration significantly.

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