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Which risk increases within a semiconductor's tunneling FET channel as gate oxide thins?

A)Sudden dopant concentration fluctuations appear
B)Increased electron wavefunction penetration occurs
C)Higher substrate crystal lattice dislocations form
D)Increased metal-insulator interface diffusion results

💡 Explanation

Increased electron wavefunction penetration will occur, because thinner gate oxides enhance quantum tunneling; electrons tunnel through the oxide layer. Therefore, leakage increases rather than lattice defects or concentration fluctuations because the tunneling probability scales exponentially with reduced barrier width.

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