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Which mechanism inhibits electron tunneling between quantum-dot orbitals in a flash memory cell?

A)Increased oxide layer thickness
B)Resonant gate voltage oscillation
C)Elevated operational temperature
D)Reduced quantum dot material density

💡 Explanation

When the oxide layer thickness increases, the probability of electron quantum tunneling exponentially decreases because tunneling probability depends inversely on the width of the potential barrier, preventing undesired charge leakage. Therefore, increased oxide thickness inhibits tunneling, rather than oscillation, increased temperature or material density which promotes tunneling.

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