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Which mechanism limits the reduction of semiconductor transistor gate oxide thickness, affecting circuit scaling?

A)Quantum tunneling through the oxide
B)Increased thermal resistance of oxide
C)Dielectric breakdown at high voltage
D)Interface trap state density increase

💡 Explanation

As gate oxide thickness decreases, electron quantum tunneling probability increases exponentially because the potential barrier width shrinks, causing unintended current leakage. Therefore quantum tunneling limits oxide thickness reduction, rather than thermal resistance, dielectric breakdown, or trap states which are related to different physical phenomena.

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