Which outcome occurs when electrons tunnel through silicon dioxide?

💡 Explanation

Gate oxide breakdown occurs because the tunneling of electrons through the thin silicon dioxide layer induces a destructive current. Therefore, breakdown results, rather than improved performance scenarios due to conductivity or absorption.

• Which consequence results when intermediate product concentration exceeds equilibrium at fixed temperature?
• Which phenomenon causes non-ideal behaviour as real gas approaches liquid phase?
• Which effect occurs to flow rate when reducing viscosity?
• Which risk increases when gallium arsenide photodiodes experience high reverse bias?
• Which mechanism limits the minimum size of a silicon-based MOSFET transistor?
• Which consequence results when approximation methods improperly normalize trial wave functions?